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1

[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Transistor matching in analog CMOS applications

Pelgrom, M.J.M., Tuinhout, H.P., Vertregt, M.

Year:

1998

Language:

english

File:

PDF, 415 KB

english, 1998

2

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Impact of interface states on MOS transistor mismatch

Andricciola, P., Tuinhout, H. P., De Vries, B., Wils, N. A. H., Scholten, A. J., Klaassen, D. B. M.

Year:

2009

Language:

english

File:

PDF, 995 KB

english, 2009

3

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Very low frequency noise characterization of semiconductor devices using DC parameter analyzers

Tuinhout, Hans, Zegers-van Duijnhoven, Adrie, Heringa, Anco

Year:

2012

Language:

english

File:

PDF, 1.18 MB

english, 2012

4

[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Record high-performance RF devices in an advanced FDSOI process enabling integrated Watt-level power amplifiers for WiFi and 5G applications

Dinh, T. V., Raucoules-aime, M., Toso, S. Dal, Ghidini, C., Hovens, B. W. C., Vroubel, M., Brunets, I., Tuinhout, H. P., Tiemeijer, L.T.F., Wils, N., Sasse, G. T., Grudowski, P.

Year:

2019

File:

PDF, 7.03 MB

2019

5

[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Characterization of matching variability and low-frequency noise for mixed-signal technologies

Year:

2013

File:

PDF, 4.11 MB

2013

6

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

Tuinhout, H.P., Montree, A.H., Schmitz, J., Stolk, P.A.

Year:

1997

Language:

english

File:

PDF, 398 KB

english, 1997

7

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Design and use of an array-based test structure to characterize mechanical stress effects caused by WLCSP solder bumps

Tuinhout, Hans, van Dalen, Rob

Year:

2016

Language:

english

File:

PDF, 42.70 MB

english, 2016

8

RF Bulk Acoustic Wave Resonators and Filters

H.P. Loebl, C. Metzmacher, R.F. Milsom, P. Lok, F. van Straten, A. Tuinhout

Journal:

Journal of Electroceramics

Year:

2004

Language:

english

File:

PDF, 599 KB

english, 2004

9

Analog circuits in ultra-deep-submicron CMOS

Annema, A.-J., Nauta, B., van Langevelde, R., Tuinhout, H.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2005

Language:

english

File:

PDF, 652 KB

english, 2005

10

[IEEE Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Portland, OR (2002.09.30-2002.09.30)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Improving BiCMOS technologies using BJT parametric mismatch characterisation

Year:

2003

Language:

english

File:

PDF, 853 KB

english, 2003

11

Comparison of soft-breakdown triggers for large-area capacitors under constant voltage stress

Schmitz, J., Tuinhout, H.P., Kretschmann, H.J., Woerlee, P.H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2001

Language:

english

File:

PDF, 176 KB

english, 2001

12

[IEEE 2002 IEEE International Ultrasonics Symposium - Munich, Germany (8-11 Oct. 2002)] 2002 IEEE Ultrasonics Symposium, 2002. Proceedings. - Combined acoustic-electromagnetic simulation of thin-film bulk acoustic wave filters

Milsom, R.F., Lobl, H.-P., Peligrad, D.N., Lobeek, J.-W., Tuinhout, A., ten Dolle, R.H.

Year:

2002

Language:

english

File:

PDF, 120 KB

english, 2002

13

Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

Magnone, P., Crupi, F., Wils, N., Jain, R., Tuinhout, H., Andricciola, P., Giusi, G., Fiegna, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 463 KB

english, 2011

14

[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Test structures for investigation of metal coverage effects on MOSFET matching

Tuinhout, H.P., Vertregt, M.

Year:

1997

Language:

english

File:

PDF, 640 KB

english, 1997

15

[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Impact of ion implantation statistics on V/sub T/ fluctuations in MOSFETs: comparison between decaborane and boron channel implants

Tuinhout, H., Widdershoven, F., Stolk, P., Schmitz, J., Dirks, B., van der Tak, K., Bancken, P., Politiek, J.

Year:

2000

Language:

english

File:

PDF, 216 KB

english, 2000

16

Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits

Pineda de Gyvez, J., Tuinhout, H.P.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2004

Language:

english

File:

PDF, 649 KB

english, 2004

17

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Characterisation of systematic MOSFET transconductance mismatch

Year:

2000

Language:

english

File:

PDF, 580 KB

english, 2000

18

[IEEE 2002 IEEE International Ultrasonics Symposium - Munich, Germany (8-11 Oct. 2002)] 2002 IEEE Ultrasonics Symposium, 2002. Proceedings. - Solidly mounted bulk acoustic wave filters for the GHz frequency range

Loebl, H.P., Metzmacher, C., Peligrad, D.N., Mauczok, R., Klee, M., Brand, W., Milsorn, R.F., Lok, P., Van Straten, R., Tuinhout, A., Lobeek, J.W.

Year:

2002

Language:

english

File:

PDF, 138 KB

english, 2002

19

Solidly Mounted Bulk Acoustic Wave Filters

Loebl, H. P., Metzmacher, C., Milsom, R. F., Tuinhout, A., Lok, P., van Straten, F.

Journal:

MRS Proceedings

Year:

2003

Language:

english

File:

PDF, 1.34 MB

english, 2003

20

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Influence of STI stress on drain current matching in advanced CMOS

Wils, Nicole, Tuinhout, Hans, Meijer, Maurice

Year:

2008

Language:

english

File:

PDF, 601 KB

english, 2008

21

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Influence of metal coverage on transistor mismatch and variability in copper damascene based CMOS technologies

Wils, Nicole, Tuinhout, Hans, Meijer, Maurice

Year:

2010

Language:

english

File:

PDF, 150 KB

english, 2010

22

[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Parametric mismatch characterization for mixed-signal technologies

Tuinhout, Hans, Wils, Nicole

Year:

2009

Language:

english

File:

PDF, 763 KB

english, 2009

23

[IEEE 1994 IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (22-25 March 1994)] Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures - Design of matching test structures [IC components]

Year:

1994

Language:

english

File:

PDF, 650 KB

english, 1994

24

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Methodology to evaluate long channel matching deterioration and effects of transistor segmentation on MOSFET matching

Tuinhout, Hans, Wils, Nicole, Meijer, Maurice, Andricciola, Pietro

Year:

2010

Language:

english

File:

PDF, 220 KB

english, 2010

25

Foot Build Registration System (FBRS) to evaluate foot posture: a reliability study with healthy subjects and patients with Charcot-Marie-Tooth disease

M. Tuinhout, P.G. Anderson, J.W.K. Louwerens

Journal:

Foot and Ankle Surgery

Year:

2009

Language:

english

File:

PDF, 274 KB

english, 2009

26

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - CMOS device optimization for mixed-signal technologies

Stolk, P.A., Tuinhout, H.P., Duffy, R., Augendre, E., Bellefroid, L.P., Bolt, M.J.B., Croon, J., Dachs, C.J.J., Huisman, F.R.J., Moonen, A.J., Ponomarev, Y.V., Roes, R.F.M., Da Rold, M., Seevinck, E.,

Year:

2001

Language:

english

File:

PDF, 414 KB

english, 2001

27

The Temperature Dependence of Mismatch in Deep-Submicrometer Bulk MOSFETs

Andricciola, P., Tuinhout, H.P.

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 333 KB

english, 2009

28

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Mismatch sources in LDMOS devices

Andricciola, Pietro, Tuinhout, Hans

Year:

2010

Language:

english

File:

PDF, 330 KB

english, 2010

29

Parametric Mismatch Characterization for Mixed-Signal Technologies

Tuinhout, H., Wils, N., Andricciola, P.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2010

Language:

english

File:

PDF, 1.63 MB

english, 2010

30

[IEEE Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Santa Barbara, CA, USA (Oct. 9-11, 2005)] Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Identification and analysis of a new BJT parametric mismatch phenomenon

Wils, N., Tuinhout, H., Ewert, T., van Berkum, J., Kaiser, M., Weemaes, R.

Year:

2005

Language:

english

File:

PDF, 2.47 MB

english, 2005

31

[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Effects of metal coverage on MOSFET matching

Tuinhout, H., Pelgrom, M., Penning de Vries, R., Vertregt, M.

Year:

1996

Language:

english

File:

PDF, 424 KB

english, 1996

32

[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Impact of Source/drain Implants on Threshold Voltage Matching in Deep Sub-micron CMOS Technologies

Dubois, J., Knol, J., Bolt, M., Tuinhout, H., Schmitz, J., Stolk, P.

Year:

2002

Language:

english

File:

PDF, 145 KB

english, 2002

33

Can diagnostic injections predict the outcome in foot and ankle arthrodesis?

Stegeman, Mark, van Ginneken, Berbke To, Boetes, Bastiaan, Tuinhout, Mirjam, Louwerens, Jan Willem, Swierstra, Bartele

Journal:

BMC Musculoskeletal Disorders

Year:

2014

Language:

english

File:

PDF, 168 KB

english, 2014

34

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch

Tuinhout, H.P., Bretveld, A., Peters, W.C.M.

Year:

2003

Language:

english

File:

PDF, 461 KB

english, 2003

35

Characterization of systematic MOSFET current factor mismatch caused by metal CMP dummy structures

Tuinhout, H.P., Vertregt, M.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2001

Language:

english

File:

PDF, 273 KB

english, 2001

36

[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ, USA (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - Design and evaluation of an integrated thin film resistor matching test structure

Tuinhout, Hans, Wils, Nicole, Huiskamp, Paul, de Koning, Eelco

Year:

2015

Language:

english

File:

PDF, 1.37 MB

english, 2015

37

[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Comparison of Mode-Conversion, Energy-Trapping and Lateral Acoustic Coupling in FBAR and SBAR

Milsom, R., Loebl, H.-P., Vanhelmont, F., Jansman, A., Lobeek, J.-W., Tuinhout, A.

Year:

2005

Language:

english

File:

PDF, 356 KB

english, 2005

38

Performance dependence of large-area silicon p-i-n photodetectors upon epitaxial thickness

M Seto, M Mabesoone, S De Jager, A Vermeulen, W De Boer, M Theunissen, H Tuinhout

Journal:

Solid-State Electronics

Year:

1997

Language:

english

File:

PDF, 416 KB

english, 1997

39

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A comparison of extraction techniques for threshold voltage mismatch

Croon, J.A., Tuinhout, H.P., Difrenza, R., Knol, J., Moonen, A.J., Decoutere, S., Maes, H.E., Sansen, W.

Year:

2002

Language:

english

File:

PDF, 448 KB

english, 2002

40

[IEEE 2004 IEEE International Solid-State Circuits Conference - San Francisco, CA, USA (15-19 Feb. 2004)] 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) - Designing outside rail constraints

Annema, A.J., Nautal, B., van Langevelde, R., Tuinhout, H.

Year:

2004

Language:

english

File:

PDF, 485 KB

english, 2004

41

[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - MOSFET effective dimensions determination for VLSI process evaluation

Year:

1989

Language:

english

File:

PDF, 269 KB

english, 1989

42

Correction [to "Development of the Incremental IEMF Method to Validate FARS (Far-field Analysis of Radiation Sources)"]

Tuinhout, Hans, Zegers-van Duijnhoven, Adrie, Heringa, Anco

Journal:

Antennas and Propagation Newsletter, IEEE Professional Group on

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

43

Evalueer veranderende voetstand

Tuinhout, Mirjam

Journal:

Year:

2015

Language:

dutch

File:

PDF, 336 KB

dutch, 2015

44

De uitdagingen van de Richtlijn Hallux Valgus (deel 1)

Tuinhout, Mirjam

Journal:

Year:

2015

Language:

dutch

File:

PDF, 3.00 MB

dutch, 2015

45

Multidisciplinaire behandeling is niet vanzelfsprekend

Tuinhout, Mirjam

Journal:

Year:

2015

Language:

dutch

File:

PDF, 2.19 MB

dutch, 2015

46

Anterieure enkelpijn: hoe herken je het en wat doe je ermee?

Tuinhout, Mirjam

Journal:

Year:

2019

Language:

dutch

File:

PDF, 1.81 MB

dutch, 2019

47

Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region

Magnone, P., Crupi, F., Wils, N., Tuinhout, H. P., Fiegna, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 866 KB

english, 2012

48

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Accurate capacitor matching measurements using floating gate test structures

Tuinhout, H.P., Elzinga, H., Brugman, J.T., Postma, F.

Year:

1995

Language:

english

File:

PDF, 666 KB

english, 1995

49

[IEEE IEEE Symposium on Ultrasonics, 2003 - Honululu, HI, USA (Oct. 5-8, 2003)] IEEE Symposium on Ultrasonics, 2003 - 2D model of solidly-mounted and membrane BAW devices

Milsom, R.F., Lobl, H.-P., Metzmacher, C., Lok, P., Tuinhout, A., van Straten, F.

Year:

2003

Language:

english

File:

PDF, 126 KB

english, 2003

50

[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Balanced lattice-ladder bandpass filter in bulk acoustic wave technology

ten Dolle, H.K.J., Lobeek, J.W., Tuinhout, A., Foekema, J.

Year:

2004

Language:

english

File:

PDF, 240 KB

english, 2004

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